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The Nanotechnology Characterization Center (CENANO), inaugurated in 2010, is dedicated mainly to research on Nanotechnology, involving different areas of knowledge. The laboratories employ advanced techniques such as: Scanning Electron Microscopy (SEM) and X-ray Photoelectron Spectroscopy (XPS), High Resolution Transmission Electron Microscopy (TEM), Scanning Electron Microscopy with Focused Ion Beam (FIB) and Confocal Laser Scanning Microscopy, in nanometric scales, for the characterization of materials and catalysts and also of conventional materials.


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