• Scanning Electron Microscope with Tungsten Filament.
SEM Model INSPECT (FEI Company)
Available features: Secondary Electron Imaging, Backscattered Electrons and EDS. Magnification: Up to 50,000x, Mode: High and Low Vacuum.
In order to carry out these analyzes it will be necessary to fill in the form for scheduling the SEM.
• High Resolution Scanning Electron Microscope with emission of electrons by a Field Emission Gun (FEG).
SEM-FEG Model QUANTA FEG 450 (FEI Company)
Available features: Secondary Electron Imaging, Backscattered Electrons, EDS, WDS, and EBSD.
Magnification: Up to 500.000x, Mode: High Vacuum, Low Vacuum and Environmental Mode.
In order to carry out these analyzes it will be necessary to fill out the form for scheduling the SEM-EGF.
• X-Ray Photoelectronic Spectroscopy (XPS).
Model PHOIBOS-150 (SPECS)
Available features: Ultra High Vacuum surface analysis using an electronic spectrometer equipped with a PHOIBOS 150 hemispherical analyzer, a double anode X-ray cannula XR-50 (Mg / Al-1.2-1.4 KeV). It also has an ion gun IQE 12/38 that allows to clean the samples and make analyzes with depth profile. This equipment allows to identify and quantify any chemical elements in a surface (Except H2 and He) of nanometric thickness (up to 10nm), in addition to electronic interactions between them. The generated files are transformed into *.vms extension. The processing and interpretation of the generated data shall be done by the applicant. The detailing for analysis scheduling must be done through the interaction between the researcher responsible for XPS and the user.
High Pressure Cell (HPC): INT's spectrometer also has a treatment chamber that can operate under conditions of temperature and pressure (dehydration [He], oxidation [O2 / He] and reduction [H2 / He]). It is in the implementation phase.
In order to carry out these analyzes, it is necessary to fill out the protocol form for receiving XPS samples.
• High-resolution Electronic Transmission Electron Microscope with emission of electrons by a Field Emission Gun (FEG).
TEM Model TECNAI G20 200kV (FEI Company)
Available resources: it operates in transmission mode from 80 to 200 kV, which allows analysis of nanostructures in high resolution (nominal values: point-to-point resolution <0.25 nm and resolution line-by-line <0.10 nm). It is equipped with scanning transmission electron microscope mode (STEM) with high angle annular dark field detector (HAADF).
Magnification: Up to 820,000x (actual) and 1,000,000x (nominal).
Resources to be implemented: STEM in high resolution and tomography module for 3D reconstructions, for both TEM and STEM.
In order to carry out these analyzes, it will be necessary to fill in the form for scheduling the TEM.
• Scanning Electron Microscope with Focused Ion Beam.
FIB Model HELIOS Nanolab DualBeam G3 CX (FEI Company)
Available Features: This microscope is a powerful tool for advanced nanoscale research through the combined use of ion and electron beams.
For nanotechnology research, the Helios NanoLab DualBeam allows users to create new research possibilities in the field of materials.
This microscope is able to produce ultrafine samples of precise prototyping for analysis by both SEM and TEM, in addition to performing analysis of elements by EDS.
In order to carry out these analyzes, it is necessary to fill out the FIB scheduling form.
• Confocal Laser Scanning Microscope & Environmental Scanning Electron Microscope
CONFOCAL Model LSM 710 (ZEISS)
Available features: Perform point-to-point or multi-point sample scanning at one go. The pixel information is used to assemble the images, which can be acquired on the x, y and z axes, allowing the visualization of three-dimensional structures of tissues or cells.
Magnification: Up to 100x.
Resources to be added: correlation of images with the Environmental Scanning Electron Microscope.
SEM Model EVO 10 (ZEISS)
Available resources: scanning at 0.2 to 30 kV voltages. Due to its vacuum configuration, it is possible to acquire images of wet samples in their natural state (environmental mode), without the need for the metallization step - indispensable in a scanning microscope.
Magnification: Up to 1,000,000x.
Resources to be operated: correlation of images with the Confocal Scanning Microscope.
To carry out these analyzes, it will be necessary to fill in the forms for scheduling in the SEM or CONFOCAL.
In addition to these analysis equipment, the center has equipment for the preparation of samples.